Ag. Chakhovskoi et al., CHARACTERIZATION OF NOVEL POWDER AND THIN-FILM RGB PHOSPHORS FOR FIELD-EMISSION DISPLAY APPLICATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(2), 1997, pp. 507-511
The spectral response, brightness, and outgassing characteristics of n
ew, low-voltage phosphors for application in field emission flat panel
displays, are presented. The tested phosphor materials include combus
tion synthesized powders and thin films prepared by rf diode or magnet
ron sputtering, laser ablation, and molecular beam epitaxy. These cath
odoluminescent materials are tested with e-beam excitation at currents
up to 50 mu A within the 200-2000 V (e.g., ''low-voltage'') and 3-8 k
V (e.g., ''medium-voltage'') ranges. The spectral coordinates are comp
ared to commercial low-voltage phosphors. Phosphor outgassing, as a fu
nction of time, is measured with a residual gas analyzer at fixed 50 m
u A beam current in the low-voltage range. We find that levels of outg
assing stabilize to low values after the first few hours of excitation
. The desorption rates measured for powder phosphor layers with differ
ent thicknesses are compared to desorption from thin films. (C) 1997 A
merican Vacuum Society.