SPIN-POLARIZED SCANNING-TUNNELING-MICROSCOPY AND ITS FAMILY

Authors
MUKASA K SUEOKA K HASEGAWA H TAZUKE Y HAYAKAWA K
Citation
K. Mukasa et al., SPIN-POLARIZED SCANNING-TUNNELING-MICROSCOPY AND ITS FAMILY, Optoelectronics, 10(2), 1995, pp. 259-268
Citations number
17
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
Optoelectronics → ACNP
ISSN journal
09125434
Volume
10
Issue
2
Year of publication
1995
Pages
259 - 268
Database
ISI
SICI code
0912-5434(1995)10:2<259:SSAIF>2.0.ZU;2-H
Abstract
In 1992 we succeeded in detecting the tunneling current, which depends on the tip magnetization and the circular polarization of the light p umping GaAs sample. This preliminary experiment indicates the feasibil ity of spin-polarized STM with nonmagnetic semiconductor tips. Further more, we are investigating exchange force microscopy (EFM), which play an important role in evaluating surface magnetism of insultating mate rials.