ELECTRON DETECTION CHARACTERISTICS OF SLOW-SCAN CCD CAMERA

The characteristics of two single-crystal YAG-based slow-scan CCD (SSC ) cameras are measured and analyzed for various electron accelerating voltages. A stream-lined procedure for characterizing electron cameras is described, especially, the procedures for the measurement of modul ation transfer function (MTF) and detector quantum efficiency (DQE). T he limiting factors on the DQE of the SSC camera are studied, and poss ible improvements in the design are discussed. These analyses should b e useful for the future improvement and optimization of SSC cameras fo r specific applications.