N. Benamar et al., THE USE OF MORPHOLOGICAL FILTERS IN COMPUTING DISPLACEMENT-FIELDS IN A SEQUENCE OF SEM IMAGES, Microscopy microanalysis microstructures, 7(4), 1996, pp. 207-215
In order to quantify the material deformation when submitted to mechan
ical solicitations, we propose a new technique based on a set of image
analysis operations. It consists in measuring the displacements of so
me geometrical points selected on the surface of the deformed material
and considered as landmarks. More details about this technique, prese
nted below, are justified by actual applications.