Magnetic resonance of epitaxial layers detected by photoluminescence

Authors
Kennedy, TA Glaser, ER
Citation
Ta. Kennedy et Er. Glaser, Magnetic resonance of epitaxial layers detected by photoluminescence, SEM SEMIMET, 51, 1998, pp. 93-136
Citations number
71
Categorie Soggetti
Current Book Contents
Journal title
IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS → ACNP
ISSN journal
00808784
Volume
51
Year of publication
1998
Part
A
Pages
93 - 136
Database
ISI
SICI code
0080-8784(1998)51:<93:MROELD>2.0.ZU;2-U