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Table of contents of journal:
Results: 6
EPR and ENDOR studies of defects in semiconductors
Authors:
Watkins, GD
Citation:
Gd. Watkins, EPR and ENDOR studies of defects in semiconductors, SEM SEMIMET, 51, 1998, pp. 1-43
Magneto-optical and electrical detection of paramagnetic resonance in semiconductors
Authors:
Spaeth, JM
Citation:
Jm. Spaeth, Magneto-optical and electrical detection of paramagnetic resonance in semiconductors, SEM SEMIMET, 51, 1998, pp. 45-92
Magnetic resonance of epitaxial layers detected by photoluminescence
Authors:
Kennedy, TA Glaser, ER
Citation:
Ta. Kennedy et Er. Glaser, Magnetic resonance of epitaxial layers detected by photoluminescence, SEM SEMIMET, 51, 1998, pp. 93-136
mu SR on muonium in semiconductors and its relation to hydrogen
Authors:
Chow, KH Hitti, B Kiefl, RF
Citation:
Kh. Chow et al., mu SR on muonium in semiconductors and its relation to hydrogen, SEM SEMIMET, 51, 1998, pp. 137-207
Positron annihilation spectroscopy of defects in semiconductors
Authors:
Saarinen, K Hautojarvi, P Corbel, C
Citation:
K. Saarinen et al., Positron annihilation spectroscopy of defects in semiconductors, SEM SEMIMET, 51, 1998, pp. 209-285
The ab initio cluster method and the dynamics of defects in semiconductors
Authors:
Jones, R Briddon, PR
Citation:
R. Jones et Pr. Briddon, The ab initio cluster method and the dynamics of defects in semiconductors, SEM SEMIMET, 51, 1998, pp. 287-349
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