Positron annihilation spectroscopy of defects in semiconductors

Authors
Saarinen, K Hautojarvi, P Corbel, C
Citation
K. Saarinen et al., Positron annihilation spectroscopy of defects in semiconductors, SEM SEMIMET, 51, 1998, pp. 209-285
Citations number
107
Categorie Soggetti
Current Book Contents
Journal title
IDENTIFICATION OF DEFECTS IN SEMICONDUCTORS → ACNP
ISSN journal
00808784
Volume
51
Year of publication
1998
Part
A
Pages
209 - 285
Database
ISI
SICI code
0080-8784(1998)51:<209:PASODI>2.0.ZU;2-0