A SURVEY OF THE THERMAL-STABILITY OF AN ACTIVE HEAT SINK

In cases where forced convective cooling alone is inadequate, or where the size of the housing limits the heat sink's dimensions, ICs can be cooled using an active heat sink. Compared to a classical finned heat sink, it can benefit from a substantial size reduction or from an imp ortant enhancement of the heat transport from the IC to its surroundin gs. The active heat sink's function is based upon a Peltier-effect coo ling system. The active heat sink controls the IC's thermal resistance to its surroundings. The Peltier-effect heat pump is a non-linear sys tem. Therefore, surveys of the system's stability are far from evident . Thermo-electric models for both the Peltier-effect heat pump and a N TCR (Negative Temperature Coefficient Resistance) temperature sensor a re presented. These are linked to thermal models for the IC packaging and a finned heat sink on one hand and to electronic models for the co ntrolling circuit on the other hand. Simulations show non-linear therm al-behaviour and system instabilities according to the power load on t he IC, to the forward amplification of the circuit, but also to the am bient temperature change. The latter phenomenon occurs after power-on of the whole device of which the IC is a part. The theoretical results were confirmed by infrared thermographic measurements on a self const ructed active heat sink. (C) 1997 Elsevier Science Ltd.