K. Luo et al., LIQUID-FILM-MEDIATED SCANNING THERMAL MICROSCOPY OF A MAGNETORESISTIVE READING HEAD, Microscale thermophysical engineering, 1(4), 1997, pp. 333-345
Magnetoresistive (MR) heads containing 45-nm-wide permalloy (NiFe) thi
n pms require current densities on the order of 10(11) A/m(2) for read
ing operation, resulting in heat generation rates of 10(15) W/m(3). Sc
anning thermal microscopy (SThM) showed a maximum temperature rise of
20 degrees C, an average temperature gradient higher than 10(6) K/m, a
nd heat flux Of 10(8) W/m(2) near the MR element. Topography-induced f
eatures on the order of 20-25 nm in size were observed in the thermal
images. Estimation of tip-sample thermal resistance, experiments in di
fferent environments, as well as calculations of liquid film thickness
and thermal resistance suggested that the dominant tip-sample heat co
nduction was dominated by a liquid film bridge. This also explained th
e topography-induced nanoscale thermal features.