FABRICATION OF P(-GATE INAS-CHANNEL HEMT BASED ON INP())

Citation
R. Koizumi et al., FABRICATION OF P(-GATE INAS-CHANNEL HEMT BASED ON INP()), Solid-state electronics, 41(10), 1997, pp. 1525-1527
Citations number
5
Journal title
ISSN journal
00381101
Volume
41
Issue
10
Year of publication
1997
Pages
1525 - 1527
Database
ISI
SICI code
0038-1101(1997)41:10<1525:FOPIHB>2.0.ZU;2-K
Abstract
We have successfully fabricated a p(+)-gate InGaAs/InAlAs HEMT with a thin InAs layer inserted in the InGaAs channel. An intrinsic transcond uctance of over 400 mS mm(-1) and maximum brain current of 250 mA mm(- 1) were obtained in a 1 mu m gate length device with relatively thick gate-to-channel barrier of 375 Angstrom. We have confirmed that the p( +)-gate InAs-channel HEMT operates as well as conventional Schottky ga te HEMT. (C) 1997 Published by Elsevier Science Ltd.