EFFECTS OF OXIDANTS ON THE DEPOSITION AND DIELECTRIC-PROPERTIES OF THE SRTIO3 THIN-FILMS PREPARED BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION (MOCVD)
Cs. Hwang et al., EFFECTS OF OXIDANTS ON THE DEPOSITION AND DIELECTRIC-PROPERTIES OF THE SRTIO3 THIN-FILMS PREPARED BY LIQUID SOURCE METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION (MOCVD), Integrated ferroelectrics, 12(2-4), 1996, pp. 199-213
SrTiO3 thin films are deposited by a liquid source metal-organic chemi
cal vapor deposition (MOCVD). The effects of oxidants on the depositio
n characteristics and dielectric properties of the films are mainly te
sted, O-2, N2O and O-2 + N2O gases are used as the oxidants and the fi
lms with Ti-rich and Sr-rich compositions are obtained when O-2 and N2
O is used, respectively. Deposition of thin initial layer under O-2 at
mosphere is very effective to obtain large dielectric constant of the
SrTiO3 thin film when the main layer is deposited under O-2 + N2O atmo
sphere. The dielectric constants of 40 nm thick SrTiO3 films with thin
O-2, N2O initial layers and without the initial layers are 235, 145 a
nd 210, respectively.