EFFECT OF REACTOR GEOMETRY AND GROWTH-PARAMETERS ON THE UNIFORMITY AND MATERIAL PROPERTIES OF GAN SAPPHIRE GROWN BY HYDRIDE VAPOR-PHASE EPITAXY/

Citation
Sa. Safvi et al., EFFECT OF REACTOR GEOMETRY AND GROWTH-PARAMETERS ON THE UNIFORMITY AND MATERIAL PROPERTIES OF GAN SAPPHIRE GROWN BY HYDRIDE VAPOR-PHASE EPITAXY/, Journal of crystal growth, 182(3-4), 1997, pp. 233-240
Citations number
20
Journal title
ISSN journal
00220248
Volume
182
Issue
3-4
Year of publication
1997
Pages
233 - 240
Database
ISI
SICI code
0022-0248(1997)182:3-4<233:EORGAG>2.0.ZU;2-B
Abstract
The effects of flow rate variation and geometry on the growth rate, gr owth uniformity and crystal quality were investigated in a horizontal gallium nitride vapor-phase epitaxy reactor. The effects of these para meters, were studied through the comparison of numerical model predict ions to experimentally observed values. Gas-phase reactions between Gr oups III and V sources and deposition of material on the wall are show n to lead to reduced overall growth rates and may be responsible for i nferior crystal quality. A low ammonia concentration is correlated wit h the deposition of polycrystalline films. A low V/III ratio and ammon ia concentration lead to inferior crystalline quality and increased ye llow luminescence. An optimum HVPE growth process requires selection o f reactor geometry and operating conditions to minimize gas-phase reac tions and wall deposition while providing a uniform reactant distribut ion across the substrate.