Sa. Safvi et al., EFFECT OF REACTOR GEOMETRY AND GROWTH-PARAMETERS ON THE UNIFORMITY AND MATERIAL PROPERTIES OF GAN SAPPHIRE GROWN BY HYDRIDE VAPOR-PHASE EPITAXY/, Journal of crystal growth, 182(3-4), 1997, pp. 233-240
The effects of flow rate variation and geometry on the growth rate, gr
owth uniformity and crystal quality were investigated in a horizontal
gallium nitride vapor-phase epitaxy reactor. The effects of these para
meters, were studied through the comparison of numerical model predict
ions to experimentally observed values. Gas-phase reactions between Gr
oups III and V sources and deposition of material on the wall are show
n to lead to reduced overall growth rates and may be responsible for i
nferior crystal quality. A low ammonia concentration is correlated wit
h the deposition of polycrystalline films. A low V/III ratio and ammon
ia concentration lead to inferior crystalline quality and increased ye
llow luminescence. An optimum HVPE growth process requires selection o
f reactor geometry and operating conditions to minimize gas-phase reac
tions and wall deposition while providing a uniform reactant distribut
ion across the substrate.