We have fabricated high-critical-temperature Josephson junctions using
a focused ion beam (FIB) milling to define the gap, in a-axis oriente
d YBa2Cu3O7 (YBCO) films. A good quality normal metal/YBCO interface i
s obtained by in situ Au deposition. The effect of FIB milling has bee
n studied with different milling conditions and the resulting devices
exhibit different I-V characteristics, i.e., flux flow or superconduct
or/normal/superconductor Josephson junction behavior. The junctions ex
hibit Shapiro steps in their I-V characteristics under microwave irrad
iation. The critical current and normal resistance product (IcRn) of t
he order of 1 mV has been obtained. We also show that there is a volta
ge modulation in the superconducting quantum interference devices as a
function of an applied magnetic flux up to 80 K. (C) 1997 American Va
cuum Society.