Z. Chen et al., DESIGN AND FABRICATION OF FRESNEL ZONE PLATES WITH LARGE NUMBERS OF ZONES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2522-2527
The advent of high-brightness x-ray sources in the 10-40 keV region op
ens new possibilities of experiments with microbeams. Techniques to fo
rm these focused beams may be based on glancing mirrors, phase element
s, or diffractive optics, in particular Fresnel zone plates (FZPs). Be
cause of the long focal length and large acceptance, FZPs designed to
work in the hard x-ray region tend to have quite large diameters and l
arge numbers of zones. For instance, the zone plate described in this
article has a 1860 mu m diam, a focal length of f=3 m (for 8 keV), and
1860 zones. On a standard pattern generator, circular shapes are alwa
ys approximated as simpler structures. The tolerance requirement for s
hape and positions of zones depends on the number of zones, and it is
necessary to guarantee that the circular structures are approximated t
o the required degree of accuracy while keeping the size of the data s
tructure to a reasonable size for processing by the exposure system. F
or instance, if polygons are used to approximate circular zones, a for
mula for the minimum acceptable number of polygon sides can be derived
. An x-ray mask for a Fresnel phase zone plate (FPZP) with 1860 zones
was designed directly in Cambridge source pattern data format and fabr
icated using the Leica Cambridge e-beam tool installed in the CXrL. Th
e zone plates presented in this article were designed for hard x rays,
and multilevel x-ray lithography was employed as a fabrication techni
que to form absorber thickness sufficient to provide the necessary pha
se shift. Minimum gold features of 0.25 mu m with thicknesses of 1.6 a
nd 3 mu m, were formed to be used with 8 and 20 keV photons, respectiv
ely. Finally, in order to estimate the quality of the zone plates duri
ng fabrication, a scanning electron microscope based moire method was
used. (C) 1997 American Vacuum Society.