SPHERICAL-ABERRATION CORRECTOR USING SPACE-CHARGE

Citation
Lc. Chao et al., SPHERICAL-ABERRATION CORRECTOR USING SPACE-CHARGE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2732-2736
Citations number
25
ISSN journal
10711023
Volume
15
Issue
6
Year of publication
1997
Pages
2732 - 2736
Database
ISI
SICI code
1071-1023(1997)15:6<2732:SCUS>2.0.ZU;2-3
Abstract
We have investigated the use of space charge for the correction of sph erical aberration in focused ion beam systems. A negative space charge cloud can be formed to reduce the spherical aberration of a lens for ions or for electrons, depending on the details of the space charge di stribution. Spherical aberration is important in focused ion beam appl ications where large aperture angles are needed to obtain high beam cu rrents used for milling or deposition, because it results in large tai ls on the current density distribution. A space charge distribution (c loud) can be produced with a small electron gun inside an electrostati c lens that can reduce this problem. We report on the properties of on e such design. (C) 1997 American Vacuum Society.