Lc. Chao et al., SPHERICAL-ABERRATION CORRECTOR USING SPACE-CHARGE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2732-2736
We have investigated the use of space charge for the correction of sph
erical aberration in focused ion beam systems. A negative space charge
cloud can be formed to reduce the spherical aberration of a lens for
ions or for electrons, depending on the details of the space charge di
stribution. Spherical aberration is important in focused ion beam appl
ications where large aperture angles are needed to obtain high beam cu
rrents used for milling or deposition, because it results in large tai
ls on the current density distribution. A space charge distribution (c
loud) can be produced with a small electron gun inside an electrostati
c lens that can reduce this problem. We report on the properties of on
e such design. (C) 1997 American Vacuum Society.