Sy. Chou et al., SUB-10 NM IMPRINT LITHOGRAPHY AND APPLICATIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(6), 1997, pp. 2897-2904
New developments, further details, and applications of imprint lithogr
aphy are presented. Arrays of 10 nm diameter and 40 nm period holes we
re imprinted not only in polymethylmethacrylate (PMMA) on silicon, but
also in PMMA on gold substrates. The smallest hole diameter imprinted
in PMMA is 6 nm. All the PMMA patterns were transferred to a metal us
ing a liftoff. In addition, PMMA mesa's of a size from 45 nm to 50 mu
m were obtained in a single imprint. Moreover, imprint lithography was
used to fabricate the silicon quantum dot, wire, and ring transistors
, which showed the same behavior as those fabricated using electron (e
)-beam lithography. Finally, imprint lithography was used to fabricate
nanocompact disks with 10 nm features and 400 Gbits/in.(2) data densi
ty-near three orders of magnitude higher than current critical dimensi
ons (CDs). A silicon scanning probe was used to read back the data suc
cessfully. The study of wear indicates that due to the ultrasmall forc
e in tapping mode, both the nano-CD and the scanning probe will not sh
ow noticeable wear after a large number of scans. (C) 1997 American Va
cuum Society.