THIN-FILM QUASI-SOI POWER MOSFET FABRICATED BY REVERSED SILICON-WAFERDIRECT BONDING

Citation
S. Matsumoto et al., THIN-FILM QUASI-SOI POWER MOSFET FABRICATED BY REVERSED SILICON-WAFERDIRECT BONDING, I.E.E.E. transactions on electron devices, 45(1), 1998, pp. 105-109
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189383
Volume
45
Issue
1
Year of publication
1998
Pages
105 - 109
Database
ISI
SICI code
0018-9383(1998)45:1<105:TQPMFB>2.0.ZU;2-M
Abstract
A quasi-SOI power MOSFET has been fabricated by reversed silicon wafer direct bonding. In this power MOSFET, the buried oxide under the chan nel and source regions is removed and the channel region is directly c onnected to the source body contact electrode to reduce the base resis tance of the parasitic npn bipolar transistor, The quasi-SOI power MOS FET can suppress the parasitic bipolar action and shows lower specific on-resistance than that of the conventional SOI power MOSFET. The fab ricated chip level quasi-SOI power MOSFET shows the specific on-resist ance of 86 m Ohm.mm(2) and on-state breakdown voltage of 30 V.