ARRAYTESTS FOR MICROLENSES

Testing microlenses in form of an array requires special optical setup s. The type of setup is strongly influenced by the complexity of the t est. If uniformity of the lenses shall be tested, only reduced complex ity of the device is required. Beside uniformity of focal length also uniformity of performance is one of the required items. The latter req uires wave aberration tests. Therefore, the most general test uses arr ays of computer generated holograms as compensators. providing planar input and output waves. The imaging of a set of lens apertures onto th e detector demands high quality optics to prevent systematic errors.