ELECTRON-PROBE X-RAY-MICROANALYSIS FOR THE ASSESSMENT OF HOMOGENEITY OF CANDIDATE REFERENCE MATERIALS AT THE NANOGRAM LEVEL

Authors
HOORNAERT S TREIGER B VALKOVIC V VANGRIEKEN R
Citation
S. Hoornaert et al., ELECTRON-PROBE X-RAY-MICROANALYSIS FOR THE ASSESSMENT OF HOMOGENEITY OF CANDIDATE REFERENCE MATERIALS AT THE NANOGRAM LEVEL, Mikrochimica acta, 128(3-4), 1998, pp. 207-213
Citations number
6
Categorie Soggetti
Chemistry Analytical
Journal title
Mikrochimica acta → ACNP
ISSN journal
00263672
Volume
128
Issue
3-4
Year of publication
1998
Pages
207 - 213
Database
ISI
SICI code
0026-3672(1998)128:3-4<207:EXFTAO>2.0.ZU;2-J
Abstract
A new approach to the assessment of homogeneity for powder samples of candidate reference materials with the help of electron probe X-ray mi croanalysis (EPMA) is proposed, It is based on the utilisation of the Kolmogorov-Smirnov statistics coupled with the Akaike Information Crit erion in the processing of the quantitative EPMA data. The evaluation of three IAEA candidate reference materials with the described approac h is discussed.