H. Doshita et al., DYNAMICAL ASPECT OF CL-2 REACTION ON SI SURFACES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 265-269
Citations number
14
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
The sticking process of Cl-2 on the Si(100) surfaces has been studied
by employing a molecular-beam method. Initial sticking probabilities,
S-0, were measured as a function of the incident energy, E-i, and the
surface temperature, T-s. The S-0 versus E-i as well as S-0 versus T-s
curves were analyzed with a kinetic model, which includes both a dire
ct sticking channel and a precursor-mediated sticking channel. The phy
sisorption lifetimes were measured as a function of T-s to evaluate th
e depth of the physisorption well and the preexponential factor for th
e detrapping rate. The potential structure and the intermediate transi
tion state relevant to the Cl-2 sticking on the Si(100) surface were d
iscussed. (C) 1998 American Vacuum Society.