DYNAMICAL ASPECT OF CL-2 REACTION ON SI SURFACES

Citation
H. Doshita et al., DYNAMICAL ASPECT OF CL-2 REACTION ON SI SURFACES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(1), 1998, pp. 265-269
Citations number
14
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
16
Issue
1
Year of publication
1998
Pages
265 - 269
Database
ISI
SICI code
0734-2101(1998)16:1<265:DAOCRO>2.0.ZU;2-J
Abstract
The sticking process of Cl-2 on the Si(100) surfaces has been studied by employing a molecular-beam method. Initial sticking probabilities, S-0, were measured as a function of the incident energy, E-i, and the surface temperature, T-s. The S-0 versus E-i as well as S-0 versus T-s curves were analyzed with a kinetic model, which includes both a dire ct sticking channel and a precursor-mediated sticking channel. The phy sisorption lifetimes were measured as a function of T-s to evaluate th e depth of the physisorption well and the preexponential factor for th e detrapping rate. The potential structure and the intermediate transi tion state relevant to the Cl-2 sticking on the Si(100) surface were d iscussed. (C) 1998 American Vacuum Society.