STUDY OF INTERFACE ASYMMETRY IN INAS-GASB HETEROJUNCTIONS

Citation
Mw. Wang et al., STUDY OF INTERFACE ASYMMETRY IN INAS-GASB HETEROJUNCTIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1689-1693
Citations number
17
Categorie Soggetti
Physics, Applied
ISSN journal
10711023
Volume
13
Issue
4
Year of publication
1995
Pages
1689 - 1693
Database
ISI
SICI code
1071-1023(1995)13:4<1689:SOIAII>2.0.ZU;2-V
Abstract
We present reflection high energy electron diffraction, secondary ion mass spectroscopy, scanning tunneling microscopy and x-ray photoelectr on spectroscopy studies of the abruptness of InAs-GaSb interfaces. We find that the interface abruptness depends on growth order: InAs grown on GaSb is extended, while GaSb grown on InAs is more abrupt. We firs t present observations of the interfacial asymmetry, including measure ments of band alignments as a function of growth order. We then examin e more detailed studies of the InAs-GaSb interface to determine the me chanisms causing the extended interface. Our results show that Sb inco rporation into the InAs overlayer and As exchange for Sb in the GaSb u nderlayer are the most likely causes of the interfacial asymmetry. (C) 1995 American Vacuum Society.