Mw. Wang et al., STUDY OF INTERFACE ASYMMETRY IN INAS-GASB HETEROJUNCTIONS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1689-1693
We present reflection high energy electron diffraction, secondary ion
mass spectroscopy, scanning tunneling microscopy and x-ray photoelectr
on spectroscopy studies of the abruptness of InAs-GaSb interfaces. We
find that the interface abruptness depends on growth order: InAs grown
on GaSb is extended, while GaSb grown on InAs is more abrupt. We firs
t present observations of the interfacial asymmetry, including measure
ments of band alignments as a function of growth order. We then examin
e more detailed studies of the InAs-GaSb interface to determine the me
chanisms causing the extended interface. Our results show that Sb inco
rporation into the InAs overlayer and As exchange for Sb in the GaSb u
nderlayer are the most likely causes of the interfacial asymmetry. (C)
1995 American Vacuum Society.