D. Vasileska et al., CALCULATION OF THE AVERAGE INTERFACE FIELD IN INVERSION-LAYERS USING ZERO-TEMPERATURE GREENS-FUNCTION FORMALISM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1841-1847
We investigate the dependence of the average interface field on the in
version and depletion charge density through the use of a zero-tempera
ture Green's function formalism for the evaluation of the broadening o
f the electronic states and conductivity. Various models for the surfa
ce-roughness autocovariance function existing in the literature, inclu
ding both Gaussian and exponential models, are studied in our calculat
ions. Besides surface-roughness scattering, the dominant scattering me
chanism at high electron densities, charged impurity, interface-trap a
nd oxide charge scattering are also included. The position of the subb
and minima, as well as the electron wave functions, are obtained by a
self-consistent solution of the Schrodinger, Poisson, and Dyson equati
ons for each value of the inversion charge density. Many-body effects
are included by considering the screened matrix elements for the scatt
ering mechanisms and through inclusion of the exchange-correlation ter
m. The dependence of the mobility and the effective field upon the inv
ersion charge density is Sensitive to the model chosen, and we discuss
the manner in which this may be used to study the interface itself. (
C) 1995 American Vacuum Society.