Gb. Raupp, PHOTOCATALYTIC OXIDATION FOR POINT-OF-USE ABATEMENT OF VOLATILE ORGANIC-COMPOUNDS IN MICROELECTRONICS MANUFACTURING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1883-1887
In gas-solid heterogeneous photocatalytic oxidation (PCO), volatile or
ganic compounds (VOCs) present in process air or air vents can be rapi
dly and completely oxidized to innocuous by-products over a near-ultra
violet (UV) illuminated titanium dioxide thin film catalyst at room te
mperature. This class of advanced oxidation processes appears to be we
ll-suited for point-of-use VOC abatement in the microelectronics manuf
acturing industry. In this article, we review industrial requirements
and unresolved technical issues in the context of the recently publish
ed Semiconductor Industry Association roadmap. The specific requiremen
ts for VOC abatement from a typical photolithography track are present
ed. Bench-scale PCO kinetics for target VOCs are reviewed to demonstra
te the typical process behavior expected. (C) 1995 American Vacuum Soc
iety.