A NEW MODEL FOR THE FIELD-DEPENDENCE OF INTRINSIC AND EXTRINSIC TIME-DEPENDENT DIELECTRIC-BREAKDOWN

Authors
DEGRAEVE R OGIER JL BELLENS R ROUSSEL PJ GROESENEKEN G MAES HE
Citation
R. Degraeve et al., A NEW MODEL FOR THE FIELD-DEPENDENCE OF INTRINSIC AND EXTRINSIC TIME-DEPENDENT DIELECTRIC-BREAKDOWN, I.E.E.E. transactions on electron devices, 45(2), 1998, pp. 472-481
Citations number
21
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
I.E.E.E. transactions on electron devices → ACNP
ISSN journal
00189383
Volume
45
Issue
2
Year of publication
1998
Pages
472 - 481
Database
ISI
SICI code
0018-9383(1998)45:2<472:ANMFTF>2.0.ZU;2-Q
Abstract
The field acceleration of intrinsic and extrinsic breakdown is studied . For the intrinsic mode an exp (1/E)- acceleration law is found, whil e for the extrinsic mode an new exp (E)-acceleration law for Q(BD) is proposed. This field acceleration model is implemented in a maximum li kelihood algorithm together with a new analytical expression for fitti ng competing Weibull distributions. With this algorithm an extensive T -BD-data set measured at different stress conditions can be fitted exc ellently in one single calculation. From the result, predictions of lo w-field oxide reliability are made and the screening conditions in ord er to guarantee a pre-set reliability specification are calculated.