DEPTH PROFILING BY FT-IR PHOTOACOUSTIC-SPECTROSCOPY

Authors
MCCELLAND JF JONES RW BAJIC SJ POWER JF
Citation
Jf. Mccelland et al., DEPTH PROFILING BY FT-IR PHOTOACOUSTIC-SPECTROSCOPY, Mikrochimica acta, 1997, pp. 613-614
Citations number
6
Categorie Soggetti
Chemistry Analytical
Journal title
Mikrochimica acta → ACNP
ISSN journal
00263672
Year of publication
1997
Supplement
14
Pages
613 - 614
Database
ISI
SICI code
0026-3672(1997):<613:DPBFP>2.0.ZU;2-Q
Abstract
Adding photoacoustic phase data to photoacoustic magnitude data allows for more complete and more quantitative depth profiling of samples wi th depth dependent composition. Phase modulation is used here to quant itatively measure layer depths in discretely layered samples. The expe ctation minimum principle is used to derive complete depth profiles of samples with smooth concentration gradients from rapid scan phase and magnitude data.