Thin films of different thicknesses, made by thiourea molecules deposi
ted on a flat silver surface roughened by treatment with chemical etch
ing solutions, have been studied by infrared reflection-absorption spe
ctroscopy. A significant enhancement (of the order of several hundreds
) of the infrared absorption cross-section of the thiourea molecules h
as been found. In agreement with the surface-enhanced Raman spectrosco
py results for the same films, it has been found that the main enhance
ment is associated with the first layer of thiourea molecules chemisor
bed on the silver surface.