FT INFRARED SEW SPECTROSCOPY OF THIN-FILMS ON METAL-SURFACES BY USINGA SINGLE COUPLING ELEMENT OR COMPOSITE SEW WAVE-GUIDES

Authors
ZHIZHIN GN SIGAREV AA YAKOVLEV VA
Citation
Gn. Zhizhin et al., FT INFRARED SEW SPECTROSCOPY OF THIN-FILMS ON METAL-SURFACES BY USINGA SINGLE COUPLING ELEMENT OR COMPOSITE SEW WAVE-GUIDES, Mikrochimica acta, 1997, pp. 669-670
Citations number
5
Categorie Soggetti
Chemistry Analytical
Journal title
Mikrochimica acta → ACNP
ISSN journal
00263672
Year of publication
1997
Supplement
14
Pages
669 - 670
Database
ISI
SICI code
0026-3672(1997):<669:FISSOT>2.0.ZU;2-I
Abstract
The example of 4-n-octadecylphenol Langmuir-Blodgett (LB) films on a c opper surface is used to show the possibility of measuring IR absorpti on spectra of thin dielectric films on a metal grating surface by mean s of surface electromagnetic wave (SEW) spectroscopy. Some methodologi cal aspects of the use of composite surface electromagnetic wave waveg uides for thin-film FT-IR spectroscopy are discussed.