COMPOSITION OF INCLUSIONS IN CDTE-BASED SOLID-SOLUTIONS

Microstructural analysis, electron microscopy, electron-probe x-ray mi croanalysis, and x-ray topography were used to study the composition o f inclusions in CdTe, Cd1-xZnxTe, and Cd1-xMnxTe (x < 0.1). According to their composition, the inclusions may be classified into three grou ps: (1) inclusions with a high (70-90%) content of Te and low (similar or equal to 1 at. %) content of the impurity elements Cr, Si, Cl, K, and S; (2) inclusions with a relatively high (>10 at. %) content of Si , Al, Fe, Mg, Cr, and Cl; low (1-7 at. %) content of Ni, Na, K, S, and O; and no Cd, Te, Zn, and Mn; and (3) inclusions containing impurity elements and stoichiometric but decreased amounts of matrix elements. No inclusions whose compositions are unique to CdTe, Cd1-xZnxTe, or Cd 1-xMnxTe were found.