DYNAMIC FAULT DICTIONARIES AND 2-STAGE FAULT ISOLATION

This paper presents dynamic two-stage fault isolation for sequential r andom logic very large scale integrated (VLSI) circuits, and introduce s limited and dynamic fault dictionaries. In the first stage of the dy namic process, a limited fault dictionary identifies candidate faults, which are further distinguished in the second stage by a dictionary g enerated dynamically for the candidate faults and a subset of the test vectors. This provides high resolution but avoids the costs of full s tatic dictionaries. Two-stage fault isolation is evaluated for benchma rk circuits and on defects in industrial circuits.