QUANTITATIVE-DETERMINATION OF LATTICE-PARAMETERS FROM CBED PATTERNS -ACCURACY AND PERFORMANCE

The algorithm developed by Rozeveld and Howe [Ultramicroscopy 50 (1993 ) 41-56] to determine multiple lattice parameters from convergent-beam electron diffraction patterns has been implemented and tested. As an example, the lattice parameters of a dispersion-strengthened aluminium specimen with triclinic distortions were extracted. The accuracy of t he procedure is discussed in detail. It can be increased considerably if dynamic instead of kinematic simulations are used. However, a uniqu e solution for the complete set of lattice parameters does not exist w ithin the experimental accuracy. (C) 1998 Elsevier Science B.V. All ri ghts reserved.