NON-GAUSSIAN ROUGHNESS OF INTERFACES - CUMULANT EXPANSION IN X-RAY AND NEUTRON REFLECTIVITY

Citation
W. Press et al., NON-GAUSSIAN ROUGHNESS OF INTERFACES - CUMULANT EXPANSION IN X-RAY AND NEUTRON REFLECTIVITY, Journal of applied crystallography, 30, 1997, pp. 963-967
Citations number
29
ISSN journal
00218898
Volume
30
Year of publication
1997
Part
6
Pages
963 - 967
Database
ISI
SICI code
0021-8898(1997)30:<963:NROI-C>2.0.ZU;2-U
Abstract
Within the Born approximation, a cumulant expansion is used for the fo rmulation of X-ray or neutron reflectivity. Odd- (third-) order cumula nts indicate asymmetric profiles; they may only be detected in layer s ystems via a Q(z). dependence of the oscillation period of Kiessig fri nges. Fourth-order cumulants are also visible in the larger Q(z) regim e for single interface systems. As an example of an asymmetric surface , a triangular height distribution function is discussed.