ON THE PEAK PROFILES IN ENERGY-DISPERSIVE POWDER X-RAY-DIFFRACTION WITH SYNCHROTRON-RADIATION

The peak profiles of standard reference materials have been investigat ed with energy-dispersive X-ray diffraction at a synchrotron source. K eeping the detector dead time below 2%, the peak profiles were essenti ally pure Gaussians independent of energy in the range investigated. P lastic deformation of ductile f.c.c.-based materials (Cu3Au and Au) le ads to increased Lorentzian contributions to the peak profiles. A sing le-line profile analysis was performed to obtain estimates of size and strain; reasonable values were found.