A NEW SINGLE-CRYSTAL MOUNTING TECHNIQUE FOR LOW-BACKGROUND HIGH-TEMPERATURE X-RAY-DIFFRACTION

Authors
SCHREUER J BAUMGARTE A STEURER W
Citation
J. Schreuer et al., A NEW SINGLE-CRYSTAL MOUNTING TECHNIQUE FOR LOW-BACKGROUND HIGH-TEMPERATURE X-RAY-DIFFRACTION, Journal of applied crystallography, 30, 1997, pp. 1162-1164
Citations number
6
Journal title
Journal of applied crystallography → ACNP
ISSN journal
00218898
Volume
30
Year of publication
1997
Part
6
Pages
1162 - 1164
Database
ISI
SICI code
0021-8898(1997)30:<1162:ANSMTF>2.0.ZU;2-N
Abstract
A new single-crystal mounting technique for high-temperature X-ray dif fraction up to 1700 K on an imaging plate scanner has been developed. The crystal is clamped mechanically by three to six very thin alumina fibres. Besides the cheap and easy manufacturing procedure, its major advantage is the resultant very low background; it consists mainly of weak, smooth Debye-Scherrer rings which can be easily removed by image -processing methods.