Exposures conducted at the NSLS R&D beamline (X-27B) for High, Aspect
Ratio Precision Manufacture have proven sufficiently successful that w
e are constructing a dedicated hard X-ray exposure beamline. The new b
eamline (X-14B) provides an exposure field similar to 120 mm wide, thr
ee times larger than that of X-27B. The scanner is based on the hydrau
lic system from the X-27B program. It is optimized for planar exposure
s and takes advantage of the full 525 mm stroke available. Exposures o
f multiple substrates and masks will be possible, with the fixturing s
upporting mounting of substrate holders from other groups (ALS, APS, C
AMD, and UW). The function of this beamline is to establish a hard X-r
ay exposure station where manufacturing scale protocols can be develop
ed and ultimately exploited for production runs.