Authors:
BUCHHOLD R
NAKLADAL A
GERLACH G
SAHRE K
EICHHORN KJ
MULLER M
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Citation: L. Kehoe et al., APPLICATION OF THE LASER FLASH DIFFUSIVITY METHOD TO THIN HIGH THERMAL-CONDUCTIVITY MATERIALS, Microsystem technologies, 5(1), 1998, pp. 18-21
Citation: G. Schiltges et al., TORSIONAL TESTS ON MICROSTRUCTURES - 2 METHODS TO DETERMINE SHEAR-MODULI, Microsystem technologies, 5(1), 1998, pp. 22-29
Citation: K. Komai et al., FRACTURE AND FATIGUE BEHAVIOR OF SINGLE-CRYSTAL SILICON MICROELEMENTSAND NANOSCOPIC AFM DAMAGE EVALUATION, Microsystem technologies, 5(1), 1998, pp. 30-37
Citation: E. Quandt et H. Holleck, TRANSDUCER AND PROTECTIVE PVD-FILMS FOR APPLICATIONS IN MICROSYSTEM COMPONENTS, Microsystem technologies, 5(1), 1998, pp. 49-58
Citation: K. Fischer et H. Guckel, LONG THROW LINEAR MAGNETIC ACTUATORS STACKABLE TO ONE MILLIMETER OF STRUCTURAL HEIGHT, Microsystem technologies, 4(4), 1998, pp. 180-183
Citation: P. Bley, INTERNATIONAL-CONFERENCE ON HIGH-ASPECT-RATIO MICROSTRUCTURE TECHNOLOGY HARMST-97, Microsystem technologies, 4(3), 1998, pp. 103-103
Citation: L. Lin et al., COMPARATIVE-STUDY OF HOT EMBOSSED MICRO STRUCTURES FABRICATED BY LABORATORY AND COMMERCIAL ENVIRONMENTS, Microsystem technologies, 4(3), 1998, pp. 113-116