The high aspect ratio, deep x-ray lithography and electrodeposition pr
ocess [Becker et al. (1986)] can be expensive unless throughput is hig
h enough. The use of a very high energy synchrotron has allowed the co
st of exposure to be significantly reduced through simultaneous exposu
re of stacked photoresist [Guckel et al (1994)]. Synchrotron radiation
at high photon energies has resulted the use of a large area x-ray ma
sk, Both stacked exposures and a large area x-ray masks have significa
ntly increased the throughput of the deep x-ray lithography and electr
odeposition process.