Is. Nuprienok et al., EFFECT OF COMBINED TREATMENT ON THE PHASE-COMPOSITION OF VANADIUM FILMS ON SILICON, Inorganic materials, 34(3), 1998, pp. 252-253
Phase changes at the V/Si interface during thermal annealing combined
with irradiation at lambda = 312.5 or 552.0 nm are characterized by el
ection diffraction, The electrical properties of the V/Si contact are
studied as a function of phase composition.