X-RAY PHOTOELECTRON-SPECTROSCOPY VALENCE-BAND DATA FOR ZNS, SRS, AND SR0.45CA0.55GA2S4 LUMINESCENT THIN-FILMS

Authors
SOSA V RACK PD HOLLOWAY PH
Citation
V. Sosa et al., X-RAY PHOTOELECTRON-SPECTROSCOPY VALENCE-BAND DATA FOR ZNS, SRS, AND SR0.45CA0.55GA2S4 LUMINESCENT THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 393-396
Citations number
12
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
Journal title
Journal of vacuum science & technology. A. Vacuum, surfaces, and films → ACNP
ISSN journal
07342101
Volume
16
Issue
2
Year of publication
1998
Pages
393 - 396
Database
ISI
SICI code
0734-2101(1998)16:2<393:XPVDFZ>2.0.ZU;2-P
Abstract
The valence band of ZnS, SrS, and Sr0.45Ca0.55Ga2S4 thin film phosphor s were measured by x-ray photoelectron spectroscopy. The valence band spectrum from polycrystalline ZnS film compared favorably with that pr eviously reported for ZnS single crystals, and with calculated theoret ical densities of states (after convolution with a Gaussian curve). Th e SrS valence band spectrum exhibited three peaks, which generally agr ee with the expected densities of states. The St(0.45)Ca(0.55)Ga(2)S(4 ) spectrum features were much less intense, consistent with the film b eing amorphous. (C) 1998 American Vacuum Society.