LAYER-BY-LAYER ETCHING OF GAAS(110) WITH HALOGENATION AND PULSED-LASER IRRADIATION

Citation
By. Han et al., LAYER-BY-LAYER ETCHING OF GAAS(110) WITH HALOGENATION AND PULSED-LASER IRRADIATION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 490-493
Citations number
20
Categorie Soggetti
Physics, Applied","Materials Science, Coatings & Films
ISSN journal
07342101
Volume
16
Issue
2
Year of publication
1998
Pages
490 - 493
Database
ISI
SICI code
0734-2101(1998)16:2<490:LEOGWH>2.0.ZU;2-X
Abstract
We have investigated the effect of laser irradiation on the terrace mo rphology of Br-covered GaAs (110). Layer-by-layer etching of GaAs (110 ) is demonstrated through laser-induced etching and atomic desorption. Nanosecond pulsed-laser irradiation (h nu=2.3 eV, pulse power similar to 35 mJ cm(-2)) of Br-GaAs (110) initially produces a high density o f small, single-layer etch pits as Br is consumed. Continued laser irr adiation causes Ga and As desorption from pit edges so that pits grow and thereby remove the remnant of the top GaAs layer. When there is Br on the surface, pit growth reflects the Br chemisorption structure (e longated along [001]) but subsequent atom desorption favors growth alo ng [110]. (C) 1998 American Vacuum Society.