IMAGING DEFECTS IN METALS WITH A POSITRON REEMISSION MICROSCOPE

Authors
CANTER KF XIE R
Citation
Kf. Canter et R. Xie, IMAGING DEFECTS IN METALS WITH A POSITRON REEMISSION MICROSCOPE, Materials chemistry and physics, 52(3), 1998, pp. 221-227
Citations number
27
Categorie Soggetti
Material Science
Journal title
Materials chemistry and physics → ACNP
ISSN journal
02540584
Volume
52
Issue
3
Year of publication
1998
Pages
221 - 227
Database
ISI
SICI code
0254-0584(1998)52:3<221:IDIMWA>2.0.ZU;2-C
Abstract
Low-energy positron beam technology is reviewed and a positron re-emis sion microscope is discussed as a new form of microscope for imaging d efects. (C) 1998 Elsevier Science S.A.