AN ANALYTICAL FULLY-DEPLETED SOI MOSFET MODEL CONSIDERING THE EFFECTSOF SELF-HEATING AND SOURCE DRAIN RESISTANCE/

Authors
Citation
Mc. Hu et Sl. Jang, AN ANALYTICAL FULLY-DEPLETED SOI MOSFET MODEL CONSIDERING THE EFFECTSOF SELF-HEATING AND SOURCE DRAIN RESISTANCE/, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 797-801
Citations number
11
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189383
Volume
45
Issue
4
Year of publication
1998
Pages
797 - 801
Database
ISI
SICI code
0018-9383(1998)45:4<797:AAFSMM>2.0.ZU;2-3
Abstract
In this paper, we present a new and analytical drain current model for submicrometer SOI MOSFET's applicable for circuit simulation, The mod el was developed by using a two-dimensional (2-D) Poisson equation, an d considering the source/drain resistance and the self-heating effect, using the present model, we can clearly see that the reduction of dra in current with the parasitic series resistance and self-heating effec t for typical SOI devices, We also can evaluate the impact of series r esistance and self-heating effects, The accuracy of the presented mode l has been verified with the experimental data of SOI MOS devices with various geometries.