Mc. Hu et Sl. Jang, AN ANALYTICAL FULLY-DEPLETED SOI MOSFET MODEL CONSIDERING THE EFFECTSOF SELF-HEATING AND SOURCE DRAIN RESISTANCE/, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 797-801
In this paper, we present a new and analytical drain current model for
submicrometer SOI MOSFET's applicable for circuit simulation, The mod
el was developed by using a two-dimensional (2-D) Poisson equation, an
d considering the source/drain resistance and the self-heating effect,
using the present model, we can clearly see that the reduction of dra
in current with the parasitic series resistance and self-heating effec
t for typical SOI devices, We also can evaluate the impact of series r
esistance and self-heating effects, The accuracy of the presented mode
l has been verified with the experimental data of SOI MOS devices with
various geometries.