Ms. Chan et al., A ROBUST AND PHYSICAL BSIM3 NON-QUASI-STATIC TRANSIENT AND AC SMALL-SIGNAL MODEL FOR CIRCUIT SIMULATION, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 834-841
A new non-quasi-static (NQS) MOSFET model, which is applicable for bot
h large-signal transient and small-signal sc analysis, has been develo
ped. It employs a physical relaxation time approach to take care of th
e finite channel charging time to reach equilibrium and the effect of
instantaneous channel charge re-distribution, The NQS model ir formula
ted independently from the de I-Tr and the charge-capacitor model, thu
s can be easily applied to any existing simulators. The model has been
implemented in the newly released BSIM3 version 3, anti comparison ha
s been made among this model, common quasi-static (QS) SPICE models an
d PISCES two-dimensional (2-D) numerical device simulator, While predi
cting accurate NQS behavior, the time penalty for using :he new model
is only about 20-30% more than the common QS models, it is much less t
han the time required by other NQS models reported. Limitations and co
mpromises between simplicity, efficiency and accuracy are also discuss
ed.