Gk. Giust et Tw. Sigmon, HIGH-PERFORMANCE THIN-FILM TRANSISTORS FABRICATED USING EXCIMER-LASERPROCESSING AND GRAIN ENGINEERING, I.E.E.E. transactions on electron devices, 45(4), 1998, pp. 925-932
High-performance polysilicon thin-film transistors (TFT's) are fabrica
ted using an excimer laser to recrystallize the undoped channel and do
pe the source-drain regions, Using a technique we call ''grain enginee
ring'' we are able to control grain microstructure using laser paramet
ers, Resulting polysilicon films are obtained with average grain sizes
of similar to 4-9 mu m in sub-100 nm thick polysilicon films without
substrate heating during the laser recrystallization process; Using a
simple four-mask self-aligned aluminum top-gate structure, we fabricat
e TFT's in these films, By combining the grain-engineered channel poly
silicon regions with laser-doped source-drain regions, TFT's are fabri
cated with electron mobilities up to 260 cm(2)/Vs and on/off current r
atios greater than 10(7). To our knowledge, these devices represent th
e highest performance laser-processed TFT's reported to date fabricate
d without substrate heating or hydrogenation.