Heteroepitaxial layers of ZnSe were grown on GaAs(1 1 0)-just and miso
riented GaAs(1 1 0) surfaces by molecular beam epitaxy (MBE). Facet fr
ee ZnSe heteroepitaxial films are achieved by growth on GaAs(1 1 0)6 d
egrees-off substrates, while ZnSe on GaAs(1 1 0)-just shows the format
ion of facets aligned along the [0 0 1] direction. A very low etch-pit
density (EPD), similar to 10(4)/cm(2), is achieved for ZnSe on GaAs(1
1 0) 6 degrees-off surface without the use of GaAs buffer layer. Chan
neling backscattering spectra and X-ray rocking curve results show tha
t good heterointerface and epitaxial layers, grown in the same orienta
tion as the GaAs(1 1 0)substrate, are obtained. (C) 1998 Elsevier Scie
nce B.V. All rights reserved.