HIGH-RESOLUTION X-RAY-DIFFRACTION AND X-RAY REFLECTIVITY STUDIES OF SHORT-PERIOD CDTE MNTE-SUPERLATTICES/

CdTe/MnTe superlattices have recently been focused on because of their magnetic properties, in particular, the magnetic coupling of the MnTe layers across the CdTe interlayers. The aim of the present paper is t he determination of the structural parameters of short-period CdTe/MnT e superlattice samples by means of X-ray diffraction and X-ray reflect ivity studies, as these parameters are essential for the interpretatio n of the experiments on the magnetic properties. Using X-ray diffracti on, we obtained the layer structure and the strain status of the super lattices. From X-ray reflectivity, information on the interface morpho logy and the replication of the interface structure during the growth of the superlattices is obtained. (C) 1998 Elsevier Science B.V. All r ights reserved.