PRODUCTION SCALE MOCVD GROWTH OF II-VI SEMICONDUCTORS

Citation
J. Sollner et al., PRODUCTION SCALE MOCVD GROWTH OF II-VI SEMICONDUCTORS, Journal of crystal growth, 185, 1998, pp. 158-162
Citations number
13
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
185
Year of publication
1998
Pages
158 - 162
Database
ISI
SICI code
0022-0248(1998)185:<158:PSMGOI>2.0.ZU;2-Z
Abstract
The growth of II-VI semiconductors is performed in MOCVD systems (AIX 200 and AIX 200/4) with a capacity of one 2 in and one 4 in wafer or e quivalent, respectively, on 2 in substrates. The growth of ZnSe, ZnSSe and ZnMgSSe has been carried out with several different precursor mat erials. The growth rate and composition homogeneities across a 2 in wa fer for ZnSe and ZnSSe, with and without rotation of the susceptor, we re investigated. The growth rate homogeneity for ZnSe was calculated t o be +/-2%. The fabrication technology can be easily transferred to mu ltiwafer reactors for the production of devices. Homogeneities in the range of +/-1% are expected, due to the unique design with double rota tion of the substrates. (C) 1998 Elsevier Science B.V. All rights rese rved.