SCHOTTKY-BARRIER TUNABILITY IN AL ZNSE INTERFACES/

Citation
M. Lazzarino et al., SCHOTTKY-BARRIER TUNABILITY IN AL ZNSE INTERFACES/, Journal of crystal growth, 185, 1998, pp. 193-198
Citations number
17
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
185
Year of publication
1998
Pages
193 - 198
Database
ISI
SICI code
0022-0248(1998)185:<193:STIAZI>2.0.ZU;2-X
Abstract
The Schottky barrier for Al/ZnSe (0 0 1) junctions was determined in s itu by X-ray photoemission spectroscopy following Al deposition on ZnS e (0 0 1) c(2 x 2), ZnSe (0 0 1) 2 x 1, or ZnSe (0 0 1) 1 x 1 surfaces fabricated by molecular beam epitaxy. While similar values of the bar rier were found on the first two types of interfaces, the p-type Schot tky barrier was 0.24 eV lower for the third type of interface. (C) 199 8 Elsevier Science B.V. All rights reserved.