The Schottky barrier for Al/ZnSe (0 0 1) junctions was determined in s
itu by X-ray photoemission spectroscopy following Al deposition on ZnS
e (0 0 1) c(2 x 2), ZnSe (0 0 1) 2 x 1, or ZnSe (0 0 1) 1 x 1 surfaces
fabricated by molecular beam epitaxy. While similar values of the bar
rier were found on the first two types of interfaces, the p-type Schot
tky barrier was 0.24 eV lower for the third type of interface. (C) 199
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