CHARACTERIZATION OF CDO THIN-FILMS DEPOSITED BY ACTIVATED REACTIVE EVAPORATION

Citation
Ktr. Reddy et al., CHARACTERIZATION OF CDO THIN-FILMS DEPOSITED BY ACTIVATED REACTIVE EVAPORATION, Journal of crystal growth, 185, 1998, pp. 1031-1034
Citations number
19
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
185
Year of publication
1998
Pages
1031 - 1034
Database
ISI
SICI code
0022-0248(1998)185:<1031:COCTDB>2.0.ZU;2-0
Abstract
The paper describes the preparation of cadmium oxide thin films produc ed by ''activated reactive evaporation'' onto heated glass substrates. The structural, electrical and optical properties of the deposited fi lms were investigated and the effect of substrate temperature on the d ifferent physical properties of the films investigated. Highly conduct ing, polycrystalline CdO films with good transmittances were prepared by controlling the deposition temperature. These layers can be used to produce CdO/CdTe solar cells with efficiencies > 7%. (C) 1998 Elsevie r Science. B.V. All rights reserved.