OXIDATION OF HG0.8CD0.2TE IN BASIC-MEDIA - AN XPS AND SPECTROSCOPIC ELLIPSOMETRY STUDY

Authors
LEFEVRE F LORANS D DEBIEMMECHOUVY C ETCHEBERRY A BALLUTAUD D TRIBOULET R
Citation
F. Lefevre et al., OXIDATION OF HG0.8CD0.2TE IN BASIC-MEDIA - AN XPS AND SPECTROSCOPIC ELLIPSOMETRY STUDY, Journal of crystal growth, 185, 1998, pp. 1237-1241
Citations number
8
Categorie Soggetti
Crystallography
Journal title
Journal of crystal growth → ACNP
ISSN journal
00220248
Volume
185
Year of publication
1998
Pages
1237 - 1241
Database
ISI
SICI code
0022-0248(1998)185:<1237:OOHIB->2.0.ZU;2-9
Abstract
(1 1 1) oriented n-type bulk Hg0.8Cd0.2Te samples are mechanochemicall y etched in a bromine ethylene-glycol solution, then immediately immer sed for oxidation in an aqueous Fe(CN)(6)(3-) basic solution. The dept h profiles of the different elements in the oxidized superficial layer and its thickness are studied by X-ray photoelectron spectroscopy (XP S) and spectroscopic ellipsometry. The results show that the oxidized layer composition is mainly governed by oxidized cadmium. (C) 1998 Els evier Science B.V. All rights reserved.