CdTe(2 1 1)B has been grown by molecular beam epitaxy (MBE) on (2 1 1)
oriented germanium as an alternative substrate. Germanium was chosen
from among several alternative substrate candidates in order to circum
vent the weaknesses of the CdTe homosubstrate. CdTe heteroepitaxy was
studied for several germanium substrate orientations. The best CdTe gr
owth condition occurs on (2 1 1) oriented germanium substrate. This or
ientation offers the compatibility required for MBE HgCdTe growth and
is the orientation commonly used. The surface morphology of CdTe layer
s with a diameter of two inches is smooth and mirror-like. The crystal
line quality was measured by an X-ray double-crystal rocking curve on
{4 2 2} planes. The best full width at half maximum (FWHM) is as low a
s 75 arcsec. A FWHM map is presented showing a good crystalline unifor
mity. Transmission electron microscopy (TEM) and secondary ion mass sp
ectrometry (SIMS) characterizations are also presented. (C) 1998 Elsev
ier Science B.V. All rights reserved.